Automated defect inspection systems by pattern recognition
- Creator: Park, Mira , Jin, Jesse S. , Au, Sherlock L. , Luo, Suhuai , Cui, Yue
- Resource Type: journal article
- Date: 2009
Pattern recognition from segmented images in automated inspection systems
- Creator: Park, Mira , Jin, Jesse S. , Au, Sherlock L. , Luo, Suhuai
- Resource Type: conference paper
- Date: 2008